Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...

For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

In this interview, News Medical speaks with Rhea Stringer, Electron Microscopist at the John Innes Centre, about the role of electron microscopy in biological imaging. Rhea discusses how advanced ...

Cryo-EM performance is fundamentally constrained not only by technical preparation challenges but also by intrinsic protein disorder, where dynamic and flexible regions remain unresolved despite ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.