For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

PORTLAND, Maine, Dec. 18, 2025 /PRNewswire/ -- The Council on International Educational Exchange (CIEE) and the Scan Design Foundation (SDF) are pleased to announce the inaugural cohort selected for ...

FARGO — Scan Design, a furniture store that is celebrating its 20th year in business, is also making a major change. In July, the business will move to West Fargo into a space left vacant by the ...

About the Scan Design Foundation Environmental Sustainability Internship in Denmark The Scan Design Foundation Environmental Sustainability Interns will participate in an 8-week work placement with a ...

"Scan chains provide a window into the chip." - Yervant Zorian, CTO of Virage Logic. "It's well known that scan chains are a major source of vulnerability in embedded systems." - Srinivas Ravi, ...

PORTLAND, Maine, July 2, 2025 /PRNewswire/ -- The Council on International Educational Exchange (CIEE) and Scan Design Foundation (SDF) are pleased to announce the inaugural edition of the Scan Design ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...