Fig. 2: Thermal, mechanical, and electrical considerations influence test cell hardware design. Source A. Meixner/Semiconductor Engineering The range of mechanical attributes includes handler opening, ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Manifold has shipped Radian® Studio, a massively parallel data engineering environment for DBMS and GIS that anyone can afford. Radian automatically runs on thousands of GPU cores plus all CPU core… ...